November 2026 | K. Zhai | APS DPP 2026 | Poster
Bayesian Integrated Data Analysis and its Application for Te / ne Profiles from TS and FIR Measurements
Copyright Notice
Certain Copyright rights accompany the materials provided herein. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material provided herein for a fee or for commercial purposes, or modifications of the content of the materials provided herein are prohibited.